British Standards Institution

With over 100 years of experience the British Standards Institute is recognised as the UK’s National standards body. Their committees work with the manufacturing and service industries, government, businesses and consumers to facilitate the production of British, European and International standards.

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BSI
UK

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Tel: 020 8996 9000

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Series details	Title	Year	Status
BS IEC 60747-2:2000	Semiconductor devices - Discrete devices and integrated circuits. Rectifier diodes (Withdrawn)	2000	Withdrawn
BS IEC 60747-4-1:2000	Semiconductor devices - Discrete devices. Microwave diodes and transistors - Microwave field effect transistors - Blank detail specification (Withdrawn)	2000	Withdrawn
BS IEC 60747-4-2:2000	Semiconductor devices - Discrete devices. Microwave diodes and transistors - Integrated-circuit microwave amplifiers - Blank detail specification (Withdrawn)	2000	Withdrawn
BS IEC 60747-5-1:1997	Discrete semiconductor devices and integrated circuits. Optoelectronic devices - General (AMD 13341) (AMD Corrigendum 13793) (AMD 14097) (Renumbered to BS EN 60747-5.1:2001) (Withdrawn)	1997	Withdrawn
BS IEC 60747-5-2:1997	Discrete semiconductor devices and integrated circuits. Optoelectronic devices - Essential ratings and characteristics (AMD 13433) (AMD 14089) (Renumbered to BS EN 60747-5.2:2001)	1997	Withdrawn
BS IEC 60747-5-3:1997	Discrete semiconductor devices and integrated circuits. Optoelectronic devices - Measuring methods (AMD 13434) (AMD 14084) (Renumbered to BS EN 60747-5.2:2001)	1997	Withdrawn
BS IEC 60747-6:2000	Semiconductor devices. Thyristors (Withdrawn)	2000	Withdrawn
BS IEC 60747-7:2000	Semiconductor devices. Bipolar transistors (Withdrawn)	2000	Withdrawn
BS IEC 60747-8:2000	Semiconductor devices. Field-effect transistors (Withdrawn)	2000	Withdrawn
BS IEC 60747-9:1998	Semiconductor devices - Discrete devices. Insulated-gate bipolar transistors (IGBTs) (AMD 13615) (AMD Corrigendum 14408) (Withdrawn)	1998	Withdrawn
BS IEC 60747-9:1998	Surface mounting technology - Discrete devices. Insulated-gate bipolar transistors (IGBTs) (AMD 13615)	1998	Withdrawn
BS IEC 60747-12-1:1995	Semiconductor devices. Optoelectronic devices. Blank detail specification for light emitting/infrared emitting diodes with/without pigtail for fibre optic systems and sub-systems (Withdrawn)	1995	Withdrawn
BS IEC 60747-12-3:1998	Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Blank detail specification for light-emitting diodes (LEDs) for display applications (Withdrawn)	1998	Withdrawn
BS IEC 60747-14-1:2000	Semiconductor devices. Semiconductor sensors. General and classification (Withdrawn)	2000	Withdrawn
BS IEC 60747-14-2:2000	Semiconductor devices. Semiconductor sensors. Hall elements	2000	Current
BS IEC 60747-14-3:2001	Semiconductor devices. Semiconductor sensors. Pressure sensors (Withdrawn)	2001	Withdrawn
BS IEC 60747-16-2:2001	Semiconductor devices. Microwave integrated circuits. Frequency prescalors (AMD 17498)	2001	Current
BS IEC 61000-2-7:1998	Electromagnetic compatibility (EMC) - Environment. Low frequency magnetic fields in various environments	1998	Current
BS IEC 61000-3-4:1998	Electromagnetic compatibility (EMC). Limits - Limitation of emission of harmonic currents in low-voltage power supply systems for equipment with rated current greater than 16A	1998	Current
BS IEC 61000-3-8:1997	Electromagnetic compatibility (EMC). Limits - Guide to signalling on low-voltage electrical installations - Emission levels, frequency bands and electromagnetic disturbance levels (AMD 10238)	1997	Current

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